Wilson, Simon and Flood, Ben and Goyal, Suresh and Masher, Jim
Parameter Estimation for a Model With Both Imperfect Test and Repair.
VLSI Test Symposium, 2007, 25th IEEE.
We describe estimation of the parameters of a
manufacturing test and repair model using data available
from that test. The model allows imperfect testing and
imperfect repair. The principal problem that we address
is of parameter identification, given insufficient data, that we address by making conservative assumptions on the
property being measured and the associated parameter
values. Several cases of commonly occurring test types, in
the manufacture of electronic products, are considered.
||Repair network; binary result; popular mean; Gaussian model; Bayesian inference techniques;
||Faculty of Science and Engineering > Computer Science
Dr. Susan Bergin
||14 Dec 2010 10:54
|Journal or Publication Title:
||VLSI Test Symposium, 2007, 25th IEEE
||IEEE VlSI Test Symposium
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