Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits

Zhang, Guoyan and Farrell, Ronan (2006) Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In: UNSPECIFIED.

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An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the conversion efficiency and the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn’t consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier by using this BIT detecting circuit has been verified, and gain and linearity information can be obtained without influencing the performance of the attached RF circuits.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Copyright © 2005 IEEE.   Reprinted from  (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NUI Maynooth ePrints and eTheses Archive's products or services.  Internal or personal use of this material is permitted.  However, permission for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
Keywords: BIT, Rectifier-based, RF
Academic Unit: Faculty of Science and Engineering > Electronic Engineering
Item ID: 586
Depositing User: Dr. Ronan Farrell
Date Deposited: 04 Jul 2007
Publisher: IEEE: Institute of Electrical and Electronics Engineers
Refereed: Yes

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