McEvoy, Paul and Farrell, Ronan
Built-In Test Engine For Memory Test.
In this paper we will present an on-chip
method for testing high performance memory
devices, that occupies minimal area and retains full
flexibility. This is achieved through microcode test
instructions and the associated on-chip state
machine. In addition, the proposed methodology
will enable at-speed testing of memory devices. The
relevancy of this work is placed in context with an
introduction to memory testing and the techniques
and algorithms generally used today.
Conference or Workshop Item
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||BIST, memory, at-speed, DFT
||Science & Engineering > Electronic Engineering
Dr. Ronan Farrell
||04 Jul 2007
||IEEE: Institute of Electrical and Electronics Engineers
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