A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits

Zhang, Guoyan and Sánchez Mora, Magdalena and Farrell, Ronan (2006) A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits. In: UNSPECIFIED.

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Built-In-Test (BIT) for Radio Frequency (RF) integrated circuits can reduce the testing cost, especially with the increase of integration level and operating frequency. A fully integrated CMOS BIT detection circuit is presented in this work. This BIT detection circuit is rectifier-based and low threshold voltage diode-connected MOS transistor with substrate positively-biased is used to improve the detecting sensitivity. As an example, a 2.4GHz LNA is used, the high frequency small signal gain is extracted and the gain fluctuation due to Process, supply Voltage and Temperature (PVT) variations is also investigated. The simulation results show that this BIT detection circuit can realize on-chip functional verification of RF circuits and also monitor the influence of PVT variations on the performance of the circuit without affecting the high frequency performance of the measured RF circuits.

Item Type: Conference or Workshop Item (Paper)
Additional Information: This paper is a postprint of a paper submitted to and accepted for publicatin in (journal/conference) and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at IET Digital Library
Academic Unit: Faculty of Science and Engineering > Electronic Engineering
Item ID: 603
Depositing User: Dr. Ronan Farrell
Date Deposited: 23 Sep 2008
Publisher: Institution of Engineering and Technology
Refereed: Yes

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